Ajit Gulabchand Central Library, Walchand College Of Engineering Sagli


   Ajit Gulabchand Central Library,
Walchand College Of Engineering Sangli

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Reliability Wearout Mechanisms in Advanced CMOS Technologies

By: Material type: TextTextLanguage: English Publication details: John Wiley and Sons, Inc Hoboken, NJ. 2009Edition: 1st EdDescription: xv,624p; 24 cmISBN:
  • 9780471731726
Subject(s): Genre/Form: DDC classification:
  • STR 620.0042
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Item type Current library Collection Shelving location Status Barcode
Reference Book Walchand College of Engineering sangli MECH R_286_MEC_PRD Available 1BOOK49216

Text in English

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