Reliability Wearout Mechanisms in Advanced CMOS Technologies (Record no. 26777)
[ view plain ]
| 000 -LEADER | |
|---|---|
| fixed length control field | 00400nam a2200145Ia 4500 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9780471731726 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Item number | STR |
| Classification number | 620.0042 |
| 041 ## - LANGUAGE CODE | |
| Language code of text/sound track or separate title | eng |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Strong, A.W.; Wu, E.Y. & Vollertsen |
| 250 ## - EDITION STATEMENT | |
| Edition statement | 1st Ed. |
| 245 ## - TITLE STATEMENT | |
| Title | Reliability Wearout Mechanisms in Advanced CMOS Technologies |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Name of publisher, distributor, etc. | John Wiley and Sons, Inc |
| Place of publication, distribution, etc. | Hoboken, NJ. |
| Date of publication, distribution, etc. | 2009 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | xv,624p. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Dimensions | 24 cm. |
| 546 ## - LANGUAGE NOTE | |
| Language note | Text in English |
| 654 ## - SUBJECT ADDED ENTRY--FACETED TOPICAL TERMS | |
| Focus term | MECH |
| 655 ## - INDEX TERM--GENRE/FORM | |
| Genre/form data or focus term | M-13 |
| Withdrawn status | Lost status | Damaged status | Not for loan | Collection code | Home library | Current library | Shelving location | Date acquired | Source of acquisition | Cost, normal purchase price | Inventory number | Barcode | Date last seen | Cost, replacement price | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| MECH | Walchand College of Engineering sangli | Walchand College of Engineering sangli | R_286_MEC_PRD | 26/08/2022 | Intercontinental Book Agency | 5619.26 | IN9767 | 1BOOK49216 | 26/08/2022 | 7024.08 | 02/06/2010 | Reference Book |