Badarayani, A. B. <br/><br/>
Genetic Algorithm Based Test Generator For Combinational Circuits In Vlsi 

 - 1st Ed. 
 - Sangli  Walchand College of Engineering  2003 
 - 250 p.  20 cm. 
<br/><br/><br/>Text in English 
<br/><br/><label>Dewey Class. No.: </label> / BAD