TY  - BOOK
AU  - Strong, A.W.; Wu, E.Y. & Vollertsen
TI  - Reliability Wearout Mechanisms in Advanced CMOS Technologies
SN  - 9780471731726
U1  - 620.0042 
PY  - 2009///
CY  - Hoboken, NJ.
PB  - John Wiley and Sons, Inc
KW  - MECH
KW  - M-13
ER  -