Navabi, Z. <br/><br/>
Digital System Test And Testable Design 

 - 1st Ed. 
 - New York  Springer  2011 
 - 435p.  26 cm. 
<br/><br/><br/>Text in English 
<br/><br/><label>ISBN: </label>9781441975478 
<br/><br/><label>Subjects--Facted Index Terms: </label><br/>ELN
<br/><br/><label>Index Terms--Genre/Form: </label><br/>F-14
<br/><br/><label>Dewey Class. No.: </label>621.38153  / NAV