TY  - BOOK
AU  - Wang, L.T.; Wu, C.W. & Wew, X.
TI  - VLSI Test Principles and Architectures : Design for Testability
SN  - 9780123705976
U1  - 621.395 
PY  - 2006///
PB  - Elsevier Publishing Company
KW  - ELN
KW  - F-02
ER  -