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Next Generation Wireless LAN Throughout, Robustness and Reliability in 802

Perabia, E. & Stacey, R.

Next Generation Wireless LAN Throughout, Robustness and Reliability in 802 - 1st Ed. - Cambridge University Press. 2008 - x, 385p. 24 cm.

Text in English

ISBN: 9780521758338

Subjects--Facted Index Terms:
ELN

Index Terms--Genre/Form:
F-02

Dewey Class. No.: 621.384 / PER

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Ajit Gulabchand Central Library, Walchand College Of Engineering Sangli

Next Generation Wireless LAN Throughout, Robustness and Reliability in 802

Ajit Gulabchand Central Library,
Walchand College Of Engineering Sangli